Work

Monte Carlo Study of Coupled SO Scattering in Si MOSFETs with High κ- Dielectric Gate Stacks: Hot Electron and Disorder Effects

Year: 2007

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-3-540-36588-4_25

Authors: J. R. Barker, J. R. Watling, A. Brown, S. Roy, P. Zeitzoff, G. Bersuker, A. Asenov

Institution: University of Glasgow

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W15727756

FWCI:

Cites: 7

Cited by: 1

Related to: 10