Work

A pattern matching processor array with defect tolerance

Year: 1986

Type: conference-paper

Source: Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference

DOI: 10.1109/isscc.1986.1156985

Authors: T. Kawada, Y. Takahashi, N. Tsuda, M. Waki, N. Hagiwara

Institution: NTT (Japan)

Language: English

Topic: Network Packet Processing and Optimization

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1582499752

FWCI: 0.413

Cites:

Cited by: 6

Related to: 10