Year: 2015
Type: article
Abstract: Chemical etching of CdTe crystals using hydrogen bromide (HBr)-based etchant was studied and its effectiveness in detector leakage current, gamma radiation detection performance was compared with that of a conventional Br-methanol (BM) etched detector. It was found that effect of surface leakage in total detector leakage current was lower in the HBr-processed detectors, and they also exhibited better radiation detection performances than that of the conventional BM-etched detectors. A slight variation in surface chemical states was found in these differently processed crystals which could be related to the observed differences in detector properties.
Source: IEEE Electron Device Letters
Authors: M. Niraula, K. Yasuda, N. Takai, M. Matsumoto, Y. Suzuki, Y. Tsukamoto, Y. Ito, S. Sugimoto, S. Kouno, D. Yamazaki, Y. Agata
Institution: Nagoya Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1607628006