An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling
Year: 2005
Type: conference-paper
Source: IEEE VLSI Test Symposium (VTS)
DOI: 10.1109/vts.2005.30
Authors: Dongwoo Hong, C. Dryden, G. Saksena
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1661340901