Work

Depth Profiling and Interface Analysis by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS): Potential, Performance and Limitations.

Year: 2006

Type: article

Source: Bulletin of the American Physical Society

Authors: Corey C. Foster, Sven Kayser, Thomas Grehl, Rudolf Moellers, E. Niehuis

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1661757334

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