Work

A new approach to scan chain reordering using physical design information

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.1998.743173

Authors: M. Hirech, J. Beausang, Xinli Gu

Institutions: Synopsys (United States), Cisco Systems (United States)

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1767514545

FWCI: 6.383

Cites: 7

Cited by: 47

Related to: 10