Work

Wide-field imaging interferometry testbed 3: metrology subsystem

Year: 2003
Type: conference-paper
Abstract: In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient environment must be monitored to allow environmental effects to be correlated with even small perturbations to fringe data. Relevant detailed anatomy of many testbed components and assemblies are described. The system of displacement measuring interferometers (DMI), optical encoders, optical alignment tools, optical power monitors, and temperature sensors implemented for control and monitoring of the testbed is presented.
Language: English
Open Access status: green
OpenAlex ID: W1789919002
FWCI: 2.794
Cites: 8
Cited by: 13
Related to: 10