Work

VHDL-based Fault Injection with VERIFY1

Year: 2001

Type: article

Authors: Volkmar Sieh, Oliver Tschäche, Frank J. Balbach

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W18035309

FWCI: 0.801

Cites: 16

Cited by: 4

Related to: 10