Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM
Year: 2011
Type: article
Abstract: The surface contamination affects Atomic Force Microscope (AFM) performance. Thermal agitation during mapping doping, thermal oxidation, annealing impurities and crystal defects promotes the roughness; various kinds of forces on the surface can be detected by the interaction between tip of cantilever and sample. This interaction not only help us to understand the characteristics and morphology of the sample but also useful to measure the surface force of the aluminum sample too.Key words: Atomic Force Microscope (AFM) performance; Thermal oxidation; Annealing impurities; Crystal defectsThe Himalayan Physics Vol.2, No.2, May, 2011Page: 76-79Uploaded Date: 1 August, 2011
Source: Himalayan Physics
DOI: 10.3126/hj.v2i2.5220
Authors: Purna B Pun, Shobha K Lamichhane
Institution: Tribhuvan University
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W1827419331