Work

Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation

Year: 2015

Type: article

Source: Experimental Mechanics

DOI: 10.1007/s11340-015-0083-4

Authors: J.C. Stinville, M.P. Echlin, D. Texier, F. Bridier, P. Bocher, T.M. Pollock

Institutions: University of California, Santa Barbara, École de Technologie Supérieure

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1896929487

FWCI: 8.828

Cites: 41

Cited by: 204

Related to: 10