Work

Recent Applications of X-Ray Topography to the Study of III-V Semiconductors

Year: 1994

Type: book-chapter

Source: Elsevier eBooks

DOI: 10.1016/b978-0-444-81889-8.50022-5

Authors: I.C. Bassignana, D.A. Macquistan

Institution: Bell (Canada)

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W190907690

FWCI:

Cites: 12

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Related to: 10