Work

Internal chip ESD phenomena beyond the protection circuit

Year: 2003

Type: conference-paper

DOI: 10.1109/relphy.1988.23419

Authors: C. Duvvury, R.N. Rountree, O. Adams

Institution: Texas Instruments (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1912437726

FWCI:

Cites: 7

Cited by: 17

Related to: 10