Work

Evaluation of capacitance and resistance standards at higher frequencies

Year: 2002

Type: conference-paper

Source: Conference on Precision Electromagnetic Measurements

DOI: 10.1109/cpem.2000.851175

Authors: Z. Svetik, R. Lapuh

Institution: Slovenian Institute of Quality and Metrology

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1917622331

FWCI: 1.067

Cites: 4

Cited by: 5

Related to: 10