Work

Effects of post metallization annealing on modulation in effective work function of platinum gate electrode in germanium metal‐oxide‐semiconductor devices

Year: 2012

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.4969

Authors: S. V. Jagadeesh Chandra, Woong‐Ki Hong, Jin‐Sung Kim, Hyobong Hong, Chel‐Jong Choi

Institutions: Jeonbuk National University, Electronics and Telecommunications Research Institute

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1925452205

FWCI:

Cites: 16

Cited by: 2

Related to: 10