Work

Thickness dependence of conduction currents in ultra thin evaporated polypropylene films

Year: 2002

Type: conference-paper

Source: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

DOI: 10.1109/ceidp.1994.592048

Authors: S. Ochiai, T. Kato, T. Ogawa, K. Kojima, Y. Uchida, A. Ohashi, M. Ieda, T. Mizutani

Institutions: Aichi Institute of Technology, Nagoya University

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1929935517

FWCI: 0.376

Cites: 1

Cited by: 1

Related to: 10