Work

Comparison of carrier profiles from spreading resistance analysis and from model calculations for abrupt doping structures

Year: 1987

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.97955

Authors: A. Casel, H. Jorke

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1964340754

FWCI: 2.73

Cites: 7

Cited by: 36

Related to: 10