Work

A spectroscopic ellipsometry investigation of RF‐sputtered crystalline vanadium pentoxide thin films

Year: 2008

Type: article

Source: Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics

DOI: 10.1002/pssc.200777744

Authors: S. Oukassi, X. Gagnard, R. Salot, D. Zahorski, J. L. Stehlé, J. P. Piel, J. P. Pereira‐Ramos

Institutions: STMicroelectronics (France), Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Sopra (France), Centre National de la Recherche Scientifique, Institut de Chimie et des Matériaux Paris-Est

Language: English

Topic: Transition Metal Oxide Nanomaterials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1964590613

FWCI:

Cites: 9

Cited by: 2

Related to: 10