Automatic correction of artifact from single-trial event-related potentials by blind source separation using second order statistics only
Year: 2006
Type: article
Source: Medical Engineering & Physics
Authors: K.H. Ting, P.C.W. Fung, C.Q. Chang, F.H.Y. Chan
Institution: University of Hong Kong
Language: English
Subfield: Signal Processing
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1964864992