Work

An optical fiber-taper probe for wafer-scale microphotonic device characterization

Year: 2007

Type: article

Abstract: A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3 x 10(6)) and a planar microring (Q = 4.8 x 10(6)).

Source: Optics Express

DOI: 10.1364/oe.15.004745

Authors: C. P. Michael, M. Borselli, T. J. Johnson, C. Chrystal, O. Painter

Institution: California Institute of Technology

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,270

Funders: National Science Foundation, Gordon and Betty Moore Foundation, National Physical Science Consortium, Defense Advanced Research Projects Agency