Work

Nonlinearity Measurements Using Alternating Current

Year: 1978

Type: article

Abstract: The nonlinearity measurement technique described uses an adapted conventional lock‐in‐amplifier. This technique enables us to measure small nonlinearities over a wide frequency band and is more sensitive than the 1/f noise measurement used to detect non‐homogeneous structures in conductors, resistors and semiconductor components. Results illustrating uses of this method are presented for different types of resistor and semiconductor structures.

Source: Active and Passive Electronic Components

DOI: 10.1155/apec.5.91

Authors: Vladimír Ryšánek, Carlo Corsi, Arnaldo d′Amico

Institutions: Czech Technical University in Prague, National Research Council

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $1,000

OpenAlex ID: W1966523232