Determination of defect distributions from admittance measurements and application to Cu(In,Ga)Se2 based heterojunctions
Year: 1996
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.363401
Authors: T. Walter, R. Herberholz, C. Müller, H. W. Schock
Institution: University of Stuttgart
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1968286323