Work

Imaging polarimeters for optical metrology

Year: 1990

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.22065

Authors: J. Larry Pezzaniti, Russell A. Chipman

Institution: University of Alabama in Huntsville

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Air Force Office of Scientific Research

OpenAlex ID: W1968777910

FWCI: 5.805

Cites:

Cited by: 19

Related to: 10