Work

ESD design automation & methodology to prevent CDM failures in 130 & 90nm ASIC design systems

Year: 2005

Type: article

Source: Journal of Electrostatics

DOI: 10.1016/j.elstat.2005.04.003

Authors: Ciaran J. Brennan, Joseph Kozhaya, Robert Proctor, Jeffrey Sloan, Shunhua Chang, James Sundquist, Terry Lowe, David Picozzi

Institution: IBM (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1969796147

FWCI: 0.308

Cites: 16

Cited by: 2

Related to: 10