Work

The locus of points of constant output VSWR around the load optimal impedance: Evaluation of power transistors robustness

Year: 2006

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg.2006.4734357

Authors: Floria Blanchet, Hind Bousbia, Denis Barataud, Jean-Michel Nebus, Denis Pache

Institutions: STMicroelectronics (France), Centre National de la Recherche Scientifique, XLIM, Université de Limoges

Language: English

Topic: Advanced Power Amplifier Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1969957724

FWCI: 0.529

Cites: 4

Cited by: 2

Related to: 10