Work

Calculation of stress probability for NBTI-aware timing analysis

Year: 2009

Type: conference-paper

Source: International Symposium on Quality Electronic Design (ISQED)

DOI: 10.1109/isqed.2009.4810381

Authors: Alexander Stempkovsky, Alexey Glebov, Sergey Gavrilov

Institution: Institute for Design Problems in Microelectronics

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1970620885

FWCI: 1.405

Cites: 13

Cited by: 20

Related to: 10