Work

Dedicated STEM for 200 to 40 keV operation

Year: 2011

Type: article

Source: The European Physical Journal Applied Physics

DOI: 10.1051/epjap/2011100429

Authors: N. Dellby, N.J. Bacon, P. Hrncirik, M.F. Murfitt, G.S. Skone, Z.S. Szilagyi, O.L. Krivanek

Institution: Nion (United States)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W1972007127

FWCI: 2.097

Cites: 33

Cited by: 50

Related to: 10