Dedicated Max-Planck beamline for the in situ investigation of interfaces and thin films
Year: 2004
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.1819552
Authors: A. Stierle, A. Steinhäuser, A. Rühm, F. U. Renner, R. Weigel, N. Kasper, H. Dosch
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1972413628