An Inverse Method for Analyzing Defects in Heterogeneous Materials
Year: 2012
Type: conference-paper
Authors: John M. Considine, David W. Vahey, Don Matthys, Robert E. Rowlands, Kevin T. Turner
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W197519733
