Work

Performance Assessment of Nanoscale Multiple Gate MOSFETs (MuGFETs) for RF Applications

Year: 2006

Type: conference-paper

Source: European Microwave Integrated Circuits Conference

DOI: 10.1109/emicc.2006.282814

Authors: Tao Lim, Abhinav Kranti, G. Armstrong

Institution: Queen's University Belfast

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1977360982

FWCI: 1.057

Cites: 7

Cited by: 2

Related to: 10