Work

Measurement of the Deformation of Silicon Substrates Coated with a Plasma-Polymerized Acrylonitrile Film

Year: 2010

Type: conference-paper

Source: Optical Interference Coatings

DOI: 10.1364/oic.2010.wb7

Authors: David Sisler, Vincent Tondiglia, Hao Jiang, Jesse O. Enlow, Rachel Jakubiak

Institutions: United States Air Force Research Laboratory, Wright-Patterson Air Force Base, U.S. Air Force Research Laboratory Materials and Manufacturing Directorate, UES (United States)

Language: English

Topic: Metal and Thin Film Mechanics

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978108237

FWCI:

Cites: 4

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Related to: 10