Apertureless scanning microscope probe as a detector of semiconductor laser emission
Year: 2015
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.4919528
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Award: G6554937906
OpenAlex ID: W1978112840
