Electron impact dissociative ionization of the CH2F2molecule: cross sections, appearance potentials, nascent kinetic energy distributions and dissociation pathways
Year: 2000
Type: article
Abstract: Ions produced by crossed-beam collisions of pulsed monoenergetic electrons and supersonic expansion molecules have been analysed by time-of-flight mass spectroscopy (TOF-MS) in order to determine the appearance potentials, absolute total, dissociative and parent ionization cross sections and nascent ion kinetic energy distributions. The electron impact study was conducted at incident electron energies up to 100 eV on the parent CH 2 F 2 molecule (and Ar/CH 2 F 2 mixtures), a fluoromethane where the CH 2 F + ion is produced at higher yields (1:18) than the parent molecule ion, CH 2 F 2 + . TOF-MS band profiles analysis has enabled us to determine the ions' nascent kinetic energy distributions, information that combined with the dissociative ionization appearance potentials, calculated molecular orbital energies and orbital bond characters, leads to improved identification of the electron impact dissociative channels.
Authors: I Torres, R Martínez, M N Sánchez Rayo, F Castaño
Institution: University of the Basque Country
Language: English
Topic: Atomic and Molecular Physics
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1978146473