Work

Ground-Fault Conditions in Low-Voltage Systems: Potential Differences Between Exposed Conductive Parts

Year: 2014

Type: article

Source: IEEE Industry Applications Magazine

DOI: 10.1109/mias.2013.2288397

Authors: Massimo Mitolo, Fabio Freschi, Haijun Liu, Michele Tartaglia

Institutions: Eaton (United States), Politecnico di Torino

Language: English

Topic: Electrical Fault Detection and Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978230650

FWCI: 1.57

Cites: 9

Cited by: 11

Related to: 10