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Investigation of theDXcenter in heavily dopedn-GaAs
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Year:
1987
Type:
article
Source:
Physical Review Letters
DOI:
10.1103/physrevlett.59.815
Authors:
D. K. Maude,
J. C. Portal,
L. Dmowski,
T. Foster,
L. Eaves,
M. Nathan,
M. Heiblum,
J. J. Harris,
R. B. Beall
show all 9
Institutions:
Centre National de la Recherche Scientifique,
University of Nottingham,
Institut National des Sciences Appliquées de Toulouse,
IBM Research - Thomas J. Watson Research Center
Language:
English
Topic:
Semiconductor materials and interfaces
Subfield:
Electronic, Optical and Magnetic Materials
Field:
Materials Science
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W1978354765
FWCI:
16.65
Cites:
14
Cited by:
148
Related to:
10