Carrier diffusion in microcrystalline silicon studied by the picosecond laser induced grating technique
Year: 2001
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.1381418
Authors: J. Kudrna, F. Trojánek, P. Malý, I. Pelant
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1978502967