Work

Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment

Year: 2013

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2013.2291274

Authors: Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto

Institutions: Fujitsu (Japan), Fujitsu Semiconductor (Japan), The University of Osaka

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Nuclear Physics

OpenAlex ID: W1978596487

FWCI: 0.982

Cites: 25

Cited by: 21

Related to: 10