Work

A new X-ray topographic defect contrast on swept quartz crystals

Year: 1988

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889888002614

Authors: M. T. Sebastian, A. Zarka, B. Capelle

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978602540

FWCI: 1.275

Cites:

Cited by: 16

Related to: 10