Work

Measurement of surface recombination velocity and bulk lifetime in Si wafers by the kinetics of excess thermal emission

Year: 2011

Type: article

Source: Semiconductors

DOI: 10.1134/s1063782611010246

Authors: A. V. Zinovchuk, A. K. Tkachenko

Institution: Zhytomyr Ivan Franko State University

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978655103

FWCI: 0.212

Cites: 13

Cited by: 5

Related to: 10