Work

Diagnosis of Hybrid Microelectronics using Transmission Acoustic Microscopy

Year: 1979

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.1979.362890

Authors: Chen S. Tsai, Chin C. Lee, Jung K. Wang

Institution: Carnegie Mellon University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1979979481

FWCI: 1.856

Cites:

Cited by: 6

Related to: 10