Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies[Note 1]
Year: 2009
Type: article
Authors: M. Fazeli, S.G. Miremadi, A. Ejlali, A. Patooghy
Institution: Sharif University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1980433502