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Towards the production of very low defect GaSb and InSb substrates: bulk crystal growth, defect analysis and scaling challenges

Year: 2013

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.2005130

Authors: R. Martinez, S. Amirhaghi, B. Smith, A. Mowbray, Mark J. Furlong, J. P. Flint, G. Dallas, G. Meshew, J. Trevethan

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1980614481

FWCI: 0.815

Cites:

Cited by: 4

Related to: 10