Work

Effect of ion treatment on the properties of In2O3:Sn films

Year: 2013

Type: article

Source: Semiconductors

DOI: 10.1134/s1063782613060146

Authors: P. N. Krylov, R. M. Zakirova, I. V. Fedotova, F. Z. Gilmutdinov

Institutions: Udmurt State University, Russian Academy of Sciences, Physico-Technical Institute

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1981065713

FWCI: 0.558

Cites: 14

Cited by: 9

Related to: 10