Work

Reliability system with two types of repair facilities

Year: 1983

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/0026-2714(83)90513-9

Authors: K. Murari, Vibha Goyal

Institution: Indian Institute of Technology Roorkee

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1981069381

FWCI: 13.54

Cites: 7

Cited by: 20

Related to: 10