Work

GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing

Year: 2013

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2013.07.019

Authors: A. Bensoussan, R. Marec, J.L. Muraro, L. Portal, P. Calvel, C. Barillot, M.G. Perichaud, L. Marchand, G. Vignon

Institutions: Thales Alenia Space (France), European Space Agency, European Space Research and Technology Centre

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Université Catholique de Louvain

OpenAlex ID: W1982774841

FWCI: 0.393

Cites: 15

Cited by: 6

Related to: 10