Work

An inversion method for the complete characterization of transparent film-absorbing substrate systems using multiple angle ellipsometry

Year: 1992

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(92)90288-n

Authors: T. Easwarakhanthan, Z. Ouennoughi, S. Ravelet

Institution: Université Henri Poincaré

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1982913873

FWCI:

Cites: 20

Cited by: 7

Related to: 10