Work

Total Dose Effects in Recessed Oxide Digital Bipolar Microcircuits

Year: 1983

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.1983.4333111

Authors: R. L. Pease, R. M. Turfler, D. Platteter, D. Emily, R. Blice

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1983149138

FWCI: 3.863

Cites: 4

Cited by: 60

Related to: 10