Work

Impact of Hot Carrier Degradation Modes on I/O nMOSFETS Aging Prediction

Year: 2006

Type: conference-paper

Source: IEEE International Integrated Reliability Workshop final report

DOI: 10.1109/irws.2006.305212

Authors: C. Guerin, V. Huard, A. Bravaix, M. Denais

Institutions: STMicroelectronics (France), Centre National de la Recherche Scientifique, Institut Supérieur de l'Électronique et du Numérique

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1985391807

FWCI: 1.583

Cites: 9

Cited by: 17

Related to: 10