Work

Observations on Imperfections in Silicon Material Using the Spreading Resistance Probe

Year: 1970

Type: article

Source: Journal of The Electrochemical Society

DOI: 10.1149/1.2407405

Authors: D. C. Gupta, J. Y. Chan, P. Wang

Institution: Texas Instruments (United States)

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1985605052

FWCI:

Cites:

Cited by: 5

Related to: 10