Year: 1999
Type: article
Abstract: Elastic recoil detection analysis technique with Δ E - E particle identification and Q3D momentum analysis has been developed to determine high resolution depth profiles in thin foils and multilayer systems. A depth resolution of 1.2nm was achieved at the surface of the samples using a high quality 100MeV 127 I beam. The method was applied to depth profile analysis of C/LiF multilayers, superconductor and GaN foil samples.
Source: Chinese Physics Letters
Authors: Xiu-qin Lu, Chang-bo Fu, Gang Liang, Ji-yu Guo, Kui Zhao, Shu-yuan Li, Jian-cheng Liu, Hua Jiang, Bing-fan Yang
Institution: China Institute of Atomic Energy
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1985647338