Work

Visualization of TlBr ionic transport mechanism by the Accelerated Device Degradation technique

Year: 2015

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

DOI: 10.1016/j.nima.2015.01.021

Authors: Amlan Datta, Piotr Becla, Shariar Motakef

Institutions: CapeSym (United States), Massachusetts Institute of Technology

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Homeland Security, Domestic Nuclear Detection Office

Award: G2308672045

OpenAlex ID: W1985697696

FWCI: 2.09

Cites: 16

Cited by: 24

Related to: 10